The following publications are possibly variants of this publication:
- Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistorsDimitrios N. Kouvatsos, Vojkan Davidovic, G. J. Papaioannou, Ninoslav Stojadinovic, L. Michalas, M. A. Exarchos, Apostolos T. Voutsas, D. Goustouridis. mr, 44(9-11):1631-1636, 2004. [doi]
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