J. S. Davis, David C. Keezer, O. Liboiron-Ladouceur, K. Bergman. Application and Demonstration of a Digital Test Core: Optoelectronic Test Bed and Wafer-level Prober. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 166-174, IEEE Computer Society, 2003. [doi]
Abstract is missing.