Benjamin Delaware, William R. Cook, Don S. Batory. Fitting the pieces together: a machine-checked model of safe composition. In Hans van Vliet, Valérie Issarny, editors, Proceedings of the 7th joint meeting of the European Software Engineering Conference and the ACM SIGSOFT International Symposium on Foundations of Software Engineering, 2009, Amsterdam, The Netherlands, August 24-28, 2009. pages 243-252, ACM, 2009. [doi]
@inproceedings{DelawareCB09-0,
title = {Fitting the pieces together: a machine-checked model of safe composition},
author = {Benjamin Delaware and William R. Cook and Don S. Batory},
year = {2009},
doi = {10.1145/1595696.1595733},
url = {http://doi.acm.org/10.1145/1595696.1595733},
tags = {Variability-Aware Analysis, composition, analysis, context-aware, safe composition},
researchr = {https://researchr.org/publication/DelawareCB09-0},
cites = {0},
citedby = {0},
pages = {243-252},
booktitle = {Proceedings of the 7th joint meeting of the European Software Engineering Conference and the ACM SIGSOFT International Symposium on Foundations of Software Engineering, 2009, Amsterdam, The Netherlands, August 24-28, 2009},
editor = {Hans van Vliet and Valérie Issarny},
publisher = {ACM},
isbn = {978-1-60558-001-2},
}