Ding Deng, Xiaowen Chen, Yang Guo. A novel power-efficient IC test scheme. IEICE Electronic Express, 14(13):20170462, 2017. [doi]
@article{DengCG17,
title = {A novel power-efficient IC test scheme},
author = {Ding Deng and Xiaowen Chen and Yang Guo},
year = {2017},
doi = {10.1587/elex.14.20170462},
url = {https://doi.org/10.1587/elex.14.20170462},
researchr = {https://researchr.org/publication/DengCG17},
cites = {0},
citedby = {0},
journal = {IEICE Electronic Express},
volume = {14},
number = {13},
pages = {20170462},
}