A Parallel Built-in Diagnostic Scheme for Multiple Embedded Memories

Li-Ming Denq, Rei-Fu Huang, Cheng-Wen Wu, Yeong-Jar Chang, Wen Ching Wu. A Parallel Built-in Diagnostic Scheme for Multiple Embedded Memories. In 12th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2004), 9-10 August 2004, San Jose, CA, USA. pages 65-69, IEEE Computer Society, 2004. [doi]

Abstract

Abstract is missing.