Self Synchronous Circuits for Error Robust Operation in Sub-100nm Processes

Benjamin Stefan Devlin, Makoto Ikeda, Kunihiro Asada. Self Synchronous Circuits for Error Robust Operation in Sub-100nm Processes. In Jens Sparsø, Montek Singh, Pascal Vivet, editors, 18th IEEE International Symposium on Asynchronous Circuits and Systems, ASYNC 2012, Kgs. Lyngby, Denmark, May 7-9, 2012. pages 150-157, IEEE Computer Society, 2012. [doi]

Abstract

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