Thierry Devoivre, Richard Rouse, Nishath Verghese, Philippe Hurat. Modeling and Validation of Silicon Contour-Based Extraction and Simulation of Non-Uniform Devices. In Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, CICC 2007, DoubleTree Hotel, San Jose, California, USA, September 16-19, 2007. pages 615-618, IEEE, 2007. [doi]
Abstract is missing.