Small-Delay Defect Coverage Metrics

Narendra Devta-Prasanna, Sandeep Kumar Goel. Small-Delay Defect Coverage Metrics. In Sandeep Kumar Goel, Krishnendu Chakrabarty, editors, Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits. pages 185-210, CRC Press, 2014.

Abstract

Abstract is missing.