Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz. Methods for improving transition delay fault coverage using broadside tests. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 10, IEEE, 2005. [doi]
Abstract is missing.