Pseudorandom BIST for test and characterization of linear and nonlinear MEMS

Achraf Dhayni, Salvador Mir, Libor Rufer, Ahcène Bounceur, Emmanuel Simeu. Pseudorandom BIST for test and characterization of linear and nonlinear MEMS. Microelectronics Journal, 40(7):1054-1061, 2009. [doi]

Abstract

Abstract is missing.