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Electro-magnetic robustness of integrated circuits: from statement to prediction

Sonia Ben Dhia, Alexandre Boyer. Electro-magnetic robustness of integrated circuits: from statement to prediction. In 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2013, Nara, Japan, December 15-18, 2013. pages 208-213, IEEE, 2013. [doi]

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