Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee. Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits. In 2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany. pages 288-293, IEEE Computer Society, 2005. [doi]
Abstract is missing.