Harshad Dhotre, Mehdi Dehbashi, Ulrike Pfannkuchen, Klaus Hofmann. Automated Optimization of Scan Chain Structure for Test Compression-Based Designs. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 185-190, IEEE Computer Society, 2016. [doi]
Abstract is missing.