Cluster-based Localization of IR-drop in Test Application considering Parasitic Elements

Harshad Dhotre, Stephan Eggersglüß, Rolf Drechsler. Cluster-based Localization of IR-drop in Test Application considering Parasitic Elements. In IEEE Latin American Test Symposium, LATS 2019, Santiago, Chile, March 11-13, 2019. pages 1-4, IEEE, 2019. [doi]

Abstract

Abstract is missing.