Jeferson C. Dias, Jônatas C. Dias, Edinei P. Legaspe, Rodrigo Lima Stoeterau, Fabrício Junqueira, Newton Maruyama, Lucas Antônio Moscato, Paulo E. Miyagi, Diolino J. Santos Filho. Treatment of Ventricular Assist Device Test Bench Data for Prediction of Failures and Improved Intrinsic Reliability. In Luis M. Camarinha-Matos, Ricardo Almeida, José Oliveira, editors, Technological Innovation for Industry and Service Systems - 10th IFIP WG 5.5/SOCOLNET Advanced Doctoral Conference on Computing, Electrical and Industrial Systems, DoCEIS 2019, Costa de Caparica, Portugal, May 8-10, 2019, Proceedings. Volume 553 of IFIP Advances in Information and Communication Technology, pages 183-190, Springer, 2019. [doi]
Abstract is missing.