Moslem Didehban, Ario Sadafi, Sajjad Salehi, Mohammad Bagher Chami. A Gate Level Analysis of Transient Faults Effects on Dual-Core Chip-Multi Processors. In Sixth International Conference on Availability, Reliability and Security, ARES 2011, Vienna, Austria, August 22-26, 2011. pages 365-370, IEEE, 2011. [doi]
Abstract is missing.