Influence of Manufacturing Variations in IDDQ Measurements: A New Test Criterion

Juan M. Díez, Juan Carlos López. Influence of Manufacturing Variations in IDDQ Measurements: A New Test Criterion. In 2000 Design, Automation and Test in Europe (DATE 2000), 27-30 March 2000, Paris, France. pages 645-649, IEEE Computer Society, 2000. [doi]

Abstract

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