Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian. March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit. In Matteo Sonza Reorda, Ondrej Novák, Bernd Straube, Hana Kubatova, Zdenek Kotásek, Pavel Kubalík, Raimund Ubar, Jiri Bucek, editors, Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), Prague, Czech Republic, April 18-21, 2006. pages 256-261, IEEE Computer Society, 2006.
Abstract is missing.