Wavelet analysis of current measurements for mixed-signal circuit testing

Michael Dimopoulos, Dimitris K. Papakostas, Basilios D. Vassios, Alkis A. Hatzopoulos. Wavelet analysis of current measurements for mixed-signal circuit testing. In International Symposium on Circuits and Systems (ISCAS 2010), May 30 - June 2, 2010, Paris, France. pages 1923-1926, IEEE, 2010. [doi]

Abstract

Abstract is missing.