Li Ding, Jing Wang, Zhangcai Huang, Atsushi Kurokawa, Yasuaki Inoue. An analytical model of the overshooting effect for multiple-input gates in nanometer technologies. In 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), Beijing, China, May 19-23, 2013. pages 1712-1715, IEEE, 2013. [doi]
Abstract is missing.