Yoshinori Dobashi, Takashi Ijiri, Hideki Todo, Kei Iwasaki, Makoto Okabe, Satoshi Nishimura. Measuring microstructures using confocal laser scanning microscopy for estimating surface roughness. In Special Interest Group on Computer Graphics and Interactive Techniques Conference, SIGGRAPH '16, Anaheim, CA, USA, July 24-28, 2016, Posters Proceedings. pages 28, ACM, 2016. [doi]
Abstract is missing.