L. R. Van den Doel, Lucas J. van Vliet, K. T. Hjelt, M. J. Vellekoop, Ian T. Young, F. Gromball, Jan G. Korvink. Nanometer-Scale Height Measurements in Micromachined Picoliter Vials Based on Interference Fringe Analysis. In ICPR. pages 3057-3062, 2000. [doi]
Abstract is missing.