A Simulation Framework for Analyzing Transient Effects Due to Thermal Noise in Sub-Threshold Circuits

Marco Donato, R. Iris Bahar, William R. Patterson, Alexander Zaslavsky. A Simulation Framework for Analyzing Transient Effects Due to Thermal Noise in Sub-Threshold Circuits. In Alex K. Jones, Hai Helen Li, Ayse Kivilcim Coskun, Martin Margala, editors, Proceedings of the 25th edition on Great Lakes Symposium on VLSI, GLVLSI 2015, Pittsburgh, PA, USA, May 20 - 22, 2015. pages 45-50, ACM, 2015. [doi]

Abstract

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