Demonstrate high Roff/Ron ratio and forming-free RRAM for rFPGA application based on switching layer engineering

Wenfeng Dong, Dong Liu, Shun Xu, Bing Chen, Yi Zhao. Demonstrate high Roff/Ron ratio and forming-free RRAM for rFPGA application based on switching layer engineering. In Yajie Qin, Zhiliang Hong, Ting-Ao Tang, editors, 12th IEEE International Conference on ASIC, ASICON 2017, Guiyang, China, October 25-28, 2017. pages 851-854, IEEE, 2017. [doi]

Abstract

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