Peng Dong, Yazhou Qin, Xuegong Yu, Xingliang Xu, Zhe Chen, Liang-Hui Li, Yingxin Cui. Electron Radiation Effects on the 4H-SiC PiN Diodes Characteristics: An Insight From Point Defects to Electrical Degradation. IEEE Access, 7:170385-170391, 2019. [doi]
Abstract is missing.