Zhuxin Dong, Uchechukwu C. Wejinya. Electrical properties measurement of Carbon Nanotubes using Atomic Force Microscope for nano sensor applications. In 5th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2010, Xiamen, China, January 20-23, 2010. pages 819-823, IEEE, 2010. [doi]
Abstract is missing.