Characterization of vertically aligned carbon nanofibers grown on Ni dots nanoelectrode array using Atomic Force Microscopy

Zhuxin Dong, Uchechukwu C. Wejinya, Imad H. Elhajj, M. Meyyappan. Characterization of vertically aligned carbon nanofibers grown on Ni dots nanoelectrode array using Atomic Force Microscopy. In 2009 IEEE/RSJ International Conference on Intelligent Robots and Systems, October 11-15, 2009, St. Louis, MO, USA. pages 1861-1866, IEEE, 2009. [doi]

Abstract

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