John F. Donlon, Eric R. Motto, Shinichi Iura. Design and Development of New Robust 3.3kV IGBT and FWD Module Chips. In Conference Record of the 2007 IEEE Industry Applications Conference Forty-Second IAS Annual Meeting, New Orleans, LA, USA, September 23-27, 2007. pages 742-748, IEEE, 2007. [doi]
Abstract is missing.