Adjacent Features for High-Density EMG Pattern Recognition

Ian M. Donovan, Kazunori Okada, Xiaorong Zhang. Adjacent Features for High-Density EMG Pattern Recognition. In 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2018, Honolulu, HI, USA, July 18-21, 2018. pages 5978-5981, IEEE, 2018. [doi]

Abstract

Abstract is missing.