Brian Dorn, Allison Elliott Tew. Becoming experts: measuring attitude development in introductory computer science. In Tracy Camp, Paul T. Tymann, J. D. Dougherty, Kris Nagel, editors, The 44th ACM Technical Symposium on Computer Science Education, SIGCSE '13, Denver, CO, USA, March 6-9, 2013. pages 183-188, ACM, 2013. [doi]
@inproceedings{DornT13-0,
title = {Becoming experts: measuring attitude development in introductory computer science},
author = {Brian Dorn and Allison Elliott Tew},
year = {2013},
doi = {10.1145/2445196.2445252},
url = {http://doi.acm.org/10.1145/2445196.2445252},
researchr = {https://researchr.org/publication/DornT13-0},
cites = {0},
citedby = {0},
pages = {183-188},
booktitle = {The 44th ACM Technical Symposium on Computer Science Education, SIGCSE '13, Denver, CO, USA, March 6-9, 2013},
editor = {Tracy Camp and Paul T. Tymann and J. D. Dougherty and Kris Nagel},
publisher = {ACM},
isbn = {978-1-4503-1868-6},
}