Zhengda Dou, Albin Yan, Jun Zhou 0016, Yuanjie Hu, Yan Chen, Tianming Ni, Jie Cui 0004, Patrick Girard 0001, Xiaoqing Wen. Design of a Highly Reliable SRAM Cell with Advanced Self-Recoverability from Soft Errors. In IEEE International Test Conference in Asia, ITC-Asia 2020, Taipei, Taiwan, September 23-25, 2020. pages 35-40, IEEE, 2020. [doi]
Abstract is missing.