James S. Doyle Jr., Kevin W. Bowyer, Patrick J. Flynn. Variation in accuracy of textured contact lens detection based on sensor and lens pattern. In IEEE Sixth International Conference on Biometrics: Theory, Applications and Systems, BTAS 2013, Arlington, VA, USA, September 29 - October 2, 2013. pages 1-7, IEEE, 2013. [doi]
Abstract is missing.