Jingbo Duan, Degang Chen, Randall L. Geiger. A low cost method for testing offset and gain error for ADC BIST. In 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea (South), May 20-23, 2012. pages 2023-2026, IEEE, 2012. [doi]
Abstract is missing.