Temperature Sensor Design in a High Volume Manufacturing 65nm CMOS Digital Process - researchr publication authors

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David E. Duarte, George Geannopoulos, Usman Mughal, Keng L. Wong, Greg Taylor. Temperature Sensor Design in a High Volume Manufacturing 65nm CMOS Digital Process. In Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, CICC 2007, DoubleTree Hotel, San Jose, California, USA, September 16-19, 2007. pages 221-224, IEEE, 2007. [doi]

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