HVM performance validation and DFM techniques used in a 32nm CMOS thermal sensor system

David E. Duarte, Paola Zepeda, Suching Hsu, Atul Maheshwari, Greg Taylor. HVM performance validation and DFM techniques used in a 32nm CMOS thermal sensor system. In Jacqueline Snyder, Rakesh Patel, Tom Andre, editors, IEEE Custom Integrated Circuits Conference, CICC 2010, San Jose, California, USA, 19-22 September, 2010, Proceedings. pages 1-4, IEEE, 2010. [doi]

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