A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress

V. Dubec, Scrgey Bychikhin, M. Blaho, Dionyz Pogany, E. Gornik, J. Willemen, N. Qu, Wolfgang Wilkening, L. Zullino, A. Andreini. A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress. Microelectronics Reliability, 43(9-11):1557-1561, 2003. [doi]

Abstract

Abstract is missing.