A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress - researchr publication authors

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V. Dubec, Scrgey Bychikhin, M. Blaho, Dionyz Pogany, E. Gornik, J. Willemen, N. Qu, Wolfgang Wilkening, L. Zullino, A. Andreini. A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress. Microelectronics Reliability, 43(9-11):1557-1561, 2003. [doi]

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