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Pattern generator card, emulation, and debug

Stephen M. Dunn, D. G. Balazich, Lawrence K. Lange, Charlotte C. Montillo. Pattern generator card, emulation, and debug. In 11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA. pages 358-360, IEEE, 1993. [doi]

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