Clyde Dunn, John MacPeak, Sean Bo, Brian Kirkpatrick, Brian Horning, Tad Grider, Corey O'Brien, Steve Heinrich-Barna, Armando Vigil, Jon Nafziger, Lyndon Preiss, Kelly DeShields, Viktor Markov, Jinho Kim, Nhan Do, Alexander Kotov. ® Technology. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-5, IEEE, 2020. [doi]
@inproceedings{DunnMBKHGOHVNPD20,
title = {® Technology},
author = {Clyde Dunn and John MacPeak and Sean Bo and Brian Kirkpatrick and Brian Horning and Tad Grider and Corey O'Brien and Steve Heinrich-Barna and Armando Vigil and Jon Nafziger and Lyndon Preiss and Kelly DeShields and Viktor Markov and Jinho Kim and Nhan Do and Alexander Kotov},
year = {2020},
doi = {10.1109/IRPS45951.2020.9128829},
url = {https://doi.org/10.1109/IRPS45951.2020.9128829},
researchr = {https://researchr.org/publication/DunnMBKHGOHVNPD20},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020},
publisher = {IEEE},
isbn = {978-1-7281-3199-3},
}