Absolute Depth Measurement Using Multiphase Normalized Cross-Correlation for Precise Optical Profilometry

Duc-Hieu Duong, Chin-Sheng Chen, Liang-Chia Chen. Absolute Depth Measurement Using Multiphase Normalized Cross-Correlation for Precise Optical Profilometry. Sensors, 19(21):4683, 2019. [doi]

Abstract

Abstract is missing.