Formal proof and test case generation for critical embedded systems using SCADE

Guy Durrieu, Odile Laurent, Christel Seguin, Virginie Wiels. Formal proof and test case generation for critical embedded systems using SCADE. In René Jacquart, editor, Building the Information Society, IFIP 18th World Computer Congress, Topical Sessions, 22-27 August 2004, Toulouse, France. pages 499-504, Kluwer, 2004.

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