Sunil Dutt, Anshu Chauhan, Sukumar Nandi, Gaurav Trivedi. Variability-aware parametric yield enhancement via post-silicon tuning of hybrid redundant MAC units. In VLSI Design, Automation and Test, VLSI-DAT 2015, Hsinchu, Taiwan, April 27-29, 2015. pages 1-4, IEEE, 2015. [doi]
Abstract is missing.