Avijit Dutta, Nur A. Touba. Multiple Bit Upset Tolerant Memory Using a Selective Cycle Avoidance Based SEC-DED-DAEC Code. In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA. pages 349-354, IEEE Computer Society, 2007. [doi]
Abstract is missing.