Henry Duwe, Xun Jian, Daniel Petrisko, Rakesh Kumar 0002. Rescuing Uncorrectable Fault Patterns in On-Chip Memories through Error Pattern Transformation. In 43rd ACM/IEEE Annual International Symposium on Computer Architecture, ISCA 2016, Seoul, South Korea, June 18-22, 2016. pages 634-644, IEEE, 2016. [doi]
Abstract is missing.