As-Robust-As-Possible test generation in the presence of small delay defects using pseudo-Boolean optimization

Stephan Eggersglüß, Rolf Drechsler. As-Robust-As-Possible test generation in the presence of small delay defects using pseudo-Boolean optimization. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 1291-1296, IEEE, 2011. [doi]

Abstract

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