Edward B. Eichelberger, Thomas W. Williams. A logic design structure for LSI testability. In Judith G. Brinsfield, Stephen A. Szygenda, David W. Hightower, editors, Proceedings of the 14th Design Automation Conference, DAC '77, New Orleans, Louisiana, USA, June 20-22, 1977. pages 462-468, ACM, 1977. [doi]
Abstract is missing.