Bastian Eisenmann, Martin Baumann, Christoph Mayer, Marcelo Lobo Heldwein. Piecewise Linear State-Space Modeling and Dimensioning of Protection Circuits for Electronic Semiconductor Fuses. In 101st IEEE Vehicular Technology Conference, VTC Spring 2025, Oslo, Norway, June 17-20, 2025. pages 1-7, IEEE, 2025. [doi]
Abstract is missing.