Aiman H. El-Maleh, S. Saqib Khursheed, Sadiq M. Sait. Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse Order Restoration and Test Relaxation. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 378-385, IEEE Computer Society, 2005. [doi]
Abstract is missing.