Michael Elad, Yacov Hel-Or, Renato Keshet. Pattern Detection Using a Maximal Rejection Classifier. In Carlo Arcelli, Luigi P. Cordella, Gabriella Sanniti di Baja, editors, Visual Form 2001, 4th International Workshop on Visual Form, IWVF-4, Capri, Italy, May 28-30, 2001, Proceedings. Volume 2059 of Lecture Notes in Computer Science, pages 514-524, Springer, 2001. [doi]
Abstract is missing.