Comparing one-class and two-class SVM classifiers for normal mammogram detection

Mona Y. Elshinawy, Abdel-Hameed A. Badawy, Wael W. Abdelmageed, Mohamed F. Chouikha. Comparing one-class and two-class SVM classifiers for normal mammogram detection. In 39th IEEE Applied Imagery Pattern Recognition Workshop, AIPR 2010, Washington, DC, USA, October 13-15, 2010. pages 1-7, IEEE Computer Society, 2010. [doi]

Abstract

Abstract is missing.